Monitoring of Fast Processes by TOFMS

Authors:

K. Fuhrer, M. Gonin, M.I. McCully, T. Egan, S.R. Ulrich,

V.W. Vaughn, W.D. Burton Jr, J.A. Schultz

Ionwerks Inc. / 2472 Bolsover / Houston, TX 77005

Kent Gillig, David H. Russell

Texas A&M University / College Station, TX

Abstract: PDF file

Poster information:
MPA023 presented at asms 2001

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